I attended and presented a poster titled _Enhancing Semantic Segmentation in High Resolution TEM Images: A Comparative Study of Batch Normalization and Instance Normalization at the The Eighth Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO24) that took place from April 21st to April 25th, 2024 at Kasteel Vaalsbroek located at the bordering point of the Netherlands, Germany and Belgium.

My colleague Karina Ruzaeva also had a poster contribution titled Unsupervised Machine Learning -based STEM Diffraction Pattern Denoising for Enchanced Grain Visualisation in Phase-Change Materials.

There were great talks and poster presentations by brilliant scientists in the field of electron microscopy. We met and started collaborations with researchers from ER-C, IEK-9 and LMU.